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P. Jaini
P. Jaini
Synopsys
Real-time computing
Fault model
Design for testing
Test compression
Automatic test equipment
1
Papers
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Minimizing the Impact of Scan Compression
2007
VTS | VLSI Test Symposium
Peter Wohl
John A. Waicukauski
Rohit Kapur
Sanjay Ramnath
Emil Gizdarski
Thomas W. Williams
P. Jaini
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Citations (41)
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