Old Web
English
Sign In
Acemap
>
authorDetail
>
Kaiyuan Chen
Kaiyuan Chen
Texas Instruments
Engineering
Annealing (metallurgy)
Electrical engineering
Focused ion beam
Analytical chemistry
5
Papers
16
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (5)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Anomalous temperature behavior in LDMOS current sensing
2007
ISPSD | International Symposium on Power Semiconductor Devices and IC's
John Lin
Sameer Pendharkar
Philip L. Hower
J. Arch
Tathagata Chatterjee
Kaiyuan Chen
Joe Devore
Binghua Hu
Joe R. Trogolo
Q. Wang
Show All
Source
Cite
Save
Citations (2)
Atomic Force Probing in Analog MOSFETs Measurement
2005
Kaiyuan Chen
Tathagata Chatterjee
Kim Hardam Christensen
Juan del Rosal
Harold Carter Edwards
Show All
Source
Cite
Save
Citations (2)
Atomic Force Probing in Analog MOSFETs Measurement
2005
Kaiyuan Chen
Tathagata Chatterjee
Kim Christensen
J. Rosal
Hal Edwards
Show All
Source
Cite
Save
Citations (2)
Recovery of shifted MOS parameters induced by focused ion beam exposure
2003
IEEE Transactions on Device and Materials Reliability
Kaiyuan Chen
Tathagata Chatterjee
Jason Parker
Tod Henderson
Richard San Martin
Hal Edwards
Show All
Source
Cite
Save
Citations (6)
Recovery of shifted MOS parameters induced by focused ion beam exposure
2002
IRPS | International Reliability Physics Symposium
Kaiyuan Chen
Tathagata Chatterjee
Jason Parker
T. Henderson
Richard San Martin
Henry Litzmann Edwards
Show All
Source
Cite
Save
Citations (4)
1