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Kim Hardam Christensen
Kim Hardam Christensen
Texas Instruments
Electronic engineering
Electrical engineering
Power semiconductor device
Electromigration
Limiting factor
3
Papers
40
Citations
0.00
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Electromigration current limit relaxation for power device interconnects
2018
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Jungwoo Joh
Young-Joon Park
Srikanth Krishnan
Kim Hardam Christensen
Jayhoon Chung
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Citations (1)
SRAM Cell Static Noise Margin and VMIN Sensitivity to Transistor Degradation
2006
IEDM | International Electron Devices Meeting
Anand T. Krishnan
Vijay Reddy
D. Aldrich
Jayesh C. Raval
Kim Hardam Christensen
J. Rosal
C. O'Brien
Rajesh Khamankar
Andrew Marshall
W. K. Loh
Randy Mckee
Srikanth Krishnan
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Citations (37)
Atomic Force Probing in Analog MOSFETs Measurement
2005
Kaiyuan Chen
Tathagata Chatterjee
Kim Hardam Christensen
Juan del Rosal
Harold Carter Edwards
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Citations (2)
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