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Jayesh C. Raval
Jayesh C. Raval
Texas Instruments
Static random-access memory
Thermal stability
Transistor
Electronic engineering
Physics
3
Papers
51
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Measurement of Bit Leakages in a Functional SRAM
2009
Xiaowei Deng
Wah Kit Loh
Beena Pious
Jayesh C. Raval
Bashar Khan
Larry Liu
Taylor Jon Lowry
DB Yoon
Theodore W. Houston
Randy Mckee
Abha Singh Kasper
Dan Corum
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A Screening Methodology for VMIN Drift in SRAM Arrays with Application to Sub-65nm Nodes
2006
IEDM | International Electron Devices Meeting
M. Ball
J. Rosal
Randy Mckee
Wk. Loh
Theodore W. Houston
R. Garcia
Jayesh C. Raval
D. Li
R. Hollingsworth
R. Gury
Robert H. Eklund
J. Vaccani
B. Castellano
F. Piacibello
S. Ashburn
Alwin J. Tsao
Anand T. Krishnan
Jay Ondrusek
T. Anderson
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Citations (14)
SRAM Cell Static Noise Margin and VMIN Sensitivity to Transistor Degradation
2006
IEDM | International Electron Devices Meeting
Anand T. Krishnan
Vijay Reddy
D. Aldrich
Jayesh C. Raval
Kim Hardam Christensen
J. Rosal
C. O'Brien
Rajesh Khamankar
Andrew Marshall
W. K. Loh
Randy Mckee
Srikanth Krishnan
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Citations (37)
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