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A. Kubo
A. Kubo
NEC
Electronic engineering
Electromigration
Copper
Physics
CMOS
3
Papers
19
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A high reliability copper dual-damascene interconnection with direct-contact via structure
2000
IEDM | International Electron Devices Meeting
Kazuyoshi Ueno
Mieko Suzuki
Akira Matsumoto
K. Motoyama
T. Tonegawa
Nobukazu Ito
K. Arita
Yasuaki Tsuchiya
T. Wake
A. Kubo
K. Sugai
Noriaki Oda
Hironobu Miyamoto
S. Saito
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Citations (10)
Full-0.56 /spl mu/m pitch copper interconnects for a high performance 0.15-/spl mu/m CMOS logic device
1999
IEDM | International Electron Devices Meeting
Manabu Iguchi
Toshiyuki Takewaki
Yoshihisa Matsubara
Yorinobu Kunimune
Nobukazu Ito
Yasuaki Tsuchiya
T. Matsui
K. Fujii
K. Motoyama
K. Sugai
A. Kubo
H. Suzuki
H Tachibana
A. Nishizawa
K. Nakabeppu
Shinya Yamasaki
Shinji Yokogawa
Y Yamamoto
T. Kunugi
S. Nakata
M. Kagamihara
A. Shida
S. Nakamoto
Hideki Gomi
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Citations (3)
A voltage-regulated static keeper technique for high-performance ASICs
1998
ASICON | International Conference on ASIC
H. Kanno
T. Saeki
H. Abiko
A. Kubo
K. Tokashiki
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Citations (6)
1