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M. Chahal
M. Chahal
Intel
Logic gate
Transistor
Engineering
Electronic engineering
Electrical engineering
4
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69
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OUTCOMES AFTER INITIAL REFUSAL OF CURATIVE TREATMENT IN PATIENTS WITH HODGKIN LYMPHOMA IN BRITISH COLUMBIA
2021
Hematological Oncology
M. Chahal
Aixiang Jiang
A. Hayden
Kerry J. Savage
Diego Villa
D. W. Scott
Alina S. Gerrie
A. Lo
M. Chan
T. Pickles
J. M. Connors
L. H. Sehn
C. Freeman
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Transistor reliability characterization and comparisons for a 14 nm tri-gate technology optimized for System-on-Chip and foundry platforms
2016
IRPS | International Reliability Physics Symposium
C. Prasad
K. W. Park
M. Chahal
I. Meric
S. Novak
S. Ramey
P. Bai
Hsu-Yu Chang
N. L. Dias
Walid M. Hafez
C-H Jan
Nidhi Nidhi
Roman W. Olac-Vaw
Rahul Ramaswamy
Curtis Tsai
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Citations (14)
Transistor reliability variation correlation to threshold voltage
2015
IRPS | International Reliability Physics Symposium
S. Ramey
M. Chahal
Pinakpani Nayak
S. Novak
C. Prasad
J. Hicks
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Citations (23)
Transistor aging and reliability in 14nm tri-gate technology
2015
IRPS | International Reliability Physics Symposium
S. Novak
C. Parker
D. Becher
Ming T. Liu
M. Agostinelli
M. Chahal
P. Packan
Pinakpani Nayak
S. Ramey
Sundararajan Natarajan
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Citations (32)
1