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Efrat Moyal
Efrat Moyal
Materials science
Electronic engineering
Nanotechnology
Analytical chemistry
improved method
4
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10
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Cross-Sectioning: Scribing and Cleaving
2019
Rebecca D. Dar
Efrat Moyal
Janet Teshima
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A controlled, mechanical method for MEMS decapsulation
2017
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
Hao Tan
Efrat Moyal
H. H. Yap
Yu Zhe Zhao
R. He
Yinzhe Ma
Binghai Liu
C. Q. Chen
Pik Kee Tan
Jeffrey Lam
Zhi Hong Mai
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Improvement of top-down delayering techniques on advanced technology nodes
2016
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
Tomáš Hrnčíř
H. H. Yap
Efrat Moyal
Janet Teshima
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Advances in FIB-SEM Analysis of TSV and Solder Bumps—Approaching Higher Precision, Throughput, and Comprehensiveness
2014
Tomáš Hrnčíř
Jiri Dluhos
Lukas Hladik
Efrat Moyal
Janet Teshima
Jaromír Kopeček
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Citations (7)
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