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Max Wu
Max Wu
Realtek
Fault model
Computer science
Real-time computing
Electronic engineering
Automatic test pattern generation
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Methodology of generating dual-cell-aware tests
2017
VTS | VLSI Test Symposium
Yu-Hao Huang
Ching-Ho Lu
Tse-Wei Wu
Yu-Teng Nien
Ying-Yen Chen
Max Wu
Jih-Nung Lee
Mango Chia-Tso Chao
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Citations (14)
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