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Masaya Muranaka
Masaya Muranaka
Optoelectronics
Electronic engineering
Dram
Analytical chemistry
Epitaxy
4
Papers
17
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Low-cost p-/p- epitaxial silicon wafers for densely packed metal-oxide-semiconductor devices
2000
Journal of The Electrochemical Society
Hirofumi Shimizu
Tomomi Satoh
Masaya Muranaka
Kazuya Makabe
Masashi Miura
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Citations (1)
The Analysis of the Defective Cells Induced by COP in a 0.3-micron-technology Node DRAM
1998
Japanese Journal of Applied Physics
Masaya Muranaka
Kazuya Makabe
Masashi Miura
Hideaki Kato
Seihachi Ide
Hidetoshi Iwai
Masao Kawamura
Yoshitaka Tadaki
Masamichi Ishihara
Toshiyuki Kaeriyama
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Citations (7)
The Analysis of Defective Cell Induced by COP in 0.3 microns Technology Node DRAM
1997
The Japan Society of Applied Physics
Masaya Muranaka
Masashi Miura
Hidetoshi Iwai
Masao Kawamura
Yoshitaka Tadaki
Toshiyuki Kaeriyama
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Citations (2)
Circuit techniques for multi-bit parallel testing of 64 Mb DRAMs and beyond
1992
VLSIC | Symposium on VLSI Circuits
Toshiyuki Sakuta
Masaya Muranaka
Hiromi Matsuura
Hitoshi Tanaka
Y. Nakagome
Kazuyuki Miyazawa
Masamichi Ishihara
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Citations (7)
1