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K Johnson
K Johnson
Intel
Materials science
Nanotechnology
Silicon
Metallurgy
Leakage (electronics)
5
Papers
67
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Challenges and Opportunities in Characterizing Modern Nano-Devices
2010
Microscopy and Microanalysis
L. Pan
X Lin
B. Miner
K Johnson
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Citations (1)
Role of Microscopy in Advanced Semiconductor Failure Analysis
2010
Microscopy and Microanalysis
Xt Tong
L. Pan
B. Miner
K Johnson
S Subramaniam
M Sacks
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TEM Contributions to Silicon Technology Advancement
2007
Microscopy and Microanalysis
K Johnson
X Lin
L. Pan
B. Miner
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TEM-based phase retrieval of p–n junction wafers using the transport of intensity equation
2007
Philosophical Magazine
Timothy Petersen
V. J. Keast
K Johnson
S Duvall
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Citations (19)
A 65nm ultra low power logic platform technology using uni-axial strained silicon transistors
2005
IEDM | International Electron Devices Meeting
C-H Jan
P. Bai
J. Choi
G. Curello
S. Jacobs
J. Jeong
K Johnson
D. Jones
S. Klopcic
J. Lin
Nick Lindert
A. Lio
S. Natarajan
J. Neirynck
P. Packan
Joodong Park
I. Post
M. Patel
S. Ramey
P. Reese
L. Rockford
A. Roskowski
G. Sacks
Bob Turkot
Yih Wang
Liqiong Wei
J. Yip
Ian A. Young
K. Zhang
Ying Zhang
M. Bohr
B. Holt
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Citations (47)
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