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Grzegorz Mrugalski
Grzegorz Mrugalski
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Computer science
Reliability engineering
Test compression
Scan chain
Code coverage
5
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6
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X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan
2021
IEEE Transactions on Very Large Scale Integration Systems
Yingdi Liu
Sylwester Milewski
Grzegorz Mrugalski
Nilanjan Mukherjee
Janusz Rajski
Jerzy Tyszer
Bartosz Wlodarczak
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Scan Chain Diagnosis-Driven Test Response Compactor
2020
ATS | Asian Test Symposium
Jakub Janicki
Grzegorz Mrugalski
Artur Stelmach
Szczepan Urban
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Test Sequence-Optimized BIST for Automotive Applications
2020
ETS | European Test Symposium
Bartosz Kaczmarek
Grzegorz Mrugalski
Nilanjan Mukherjee
Janusz Rajski
Lukasz Rybak
Jerzy Tyszer
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On Cyclic Scan Integrity Tests for EDT-based Compression.
2019
VTS | VLSI Test Symposium
Wu-Tung Cheng
Grzegorz Mrugalski
Janusz Rajski
Maciej Trawka
Jerzy Tyszer
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Autonomous Scan Patterns for Laser Voltage Imaging
2019
IEEE Transactions on Emerging Topics in Computing
Jerzy Tyszer
Wu-Tung Cheng
Sylwester Milewski
Grzegorz Mrugalski
Janusz Rajski
Maciej Trawka
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