Old Web
English
Sign In
Acemap
>
authorDetail
>
M. Denais
M. Denais
NXP Semiconductors
Physics
Electronic engineering
Optoelectronics
Gate oxide
CMOS
3
Papers
254
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
On-the-fly characterization of NBTI in ultra-thin gate oxide PMOSFET's
2004
IEDM | International Electron Devices Meeting
M. Denais
C. Parthasarathy
G. Ribes
Y. Rey-Tauriac
N. Revil
A. Bravaix
V. Huard
F. Perrier
Show All
Source
Cite
Save
Citations (230)
Gate stack optimization for 65 nm CMOS low power and high performance platform
2004
IEDM | International Electron Devices Meeting
B. Duriez
B. Tavel
R. Boeuf
M.T. Basso
Yves Laplanche
C. Ortolland
D. Reber
R. Wacquant
Pierre Morin
Damien Lenoble
R. Palla
M. Bidaud
D. Barge
C. Dachs
H. Brut
D. Roy
M. Marin
F. Payet
N. Cagnat
R. Difrenza
K. Rochereau
M. Denais
P. Stolk
M. Woo
F. Arnaud
Show All
Source
Cite
Save
Citations (8)
Thin oxynitride solution for digital and mixed-signal 65nm CMOS platform
2003
IEDM | International Electron Devices Meeting
B. Tavel
M. Bidaud
N. Emonet
D. Barge
N. Planes
H. Brut
D. Roy
J. C. Vildeuil
R. Difrenza
K. Rochereau
M. Denais
V. Huard
P. Llinares
S. Bruyere
C. Parthasarthy
N. Revil
R. Pantel
F. Guyader
L. Vishnubotla
K. Barla
F. Arnaud
P. Stolk
M. Woo
Show All
Source
Cite
Save
Citations (16)
1