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Younggon Lee
Younggon Lee
SK Hynix
Analytical chemistry
Capacitor
Capacitance
Chemistry
Electronic engineering
3
Papers
10
Citations
0
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A Sensitivity Map-Based Approach to Profile Defects in MIM Capacitors From ${I}$ – ${V}$ , ${C}$ – ${V}$ , and ${G}$ – ${V}$ Measurements
2019
IEEE Transactions on Electron Devices
Andrea Padovani
Ben Kaczer
Milan Pešić
Attilio Belmonte
M. Popovici
Laura Nyns
Dimitri Linten
Valeri Afanas'ev
Ilya Shlyakhov
Younggon Lee
Hokyung Park
Luca Larcher
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Citations (7)
Time Domain Reflectometry Analysis of the Dispersion of Metal–Insulator–Metal Capacitance
2017
IEEE Electron Device Letters
Jinwoo Noh
Seung Mo Kim
Sunwoo Heo
Soo Cheol Kang
Yonghun Kim
Younggon Lee
Hokyung Park
Seokkiu Lee
Byoung Hun Lee
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Citations (3)
A Comparative Study on 1D and 2D Hydraulic Analysis Model for Emergency Action Plan
2016
Tae-Hyung Kim
Ji Sung Kim
Younggon Lee
Jae Won Kwak
Kyu-Hyun Choi
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