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Noriaki Shinohara
Noriaki Shinohara
Silicon nitride
Non-volatile memory
Bit cell
Chemical vapor deposition
Oxide
2
Papers
6
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0
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Electron Spin Resonance and Photoluminescence Study of Charge Trap Centers in Silicon Nitride Films and Fabrication of Proposed Oxide?Nitride?Oxide Sidewall 2-bit/Cell Nonvolatile Memories
2008
Japanese Journal of Applied Physics
Atsushi Toki
Noriaki Shinohara
Yoshiaki Kamigaki
Masayuki Nakano
Akihide Shibata
Tetsuya Okumine
Takeshi Shiomi
K. Sugimoto
Tetsu Negishi
Fumiyoshi Yoshioka
Hiroshi Kotaki
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Citations (6)
ESR and PL Study of Charge Trapping Centers in Silicon Nitride Films and Its Verification with Novel ONO-Sidewall 2-bit/cell Nonvolatile Memory
2007
The Japan Society of Applied Physics
Atsushi Toki
Noriaki Shinohara
Masayuki Nakano
Hiroshi Kotaki
Yoshiaki Kamigaki
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