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U. Celano
U. Celano
Geballe Laboratory for Advanced Materials
Semiconductor device
Metrology
Computer science
Dimensional metrology
Electron mobility
2
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110
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Publisher Correction: Metrology for the next generation of semiconductor devices
2018
Ndubuisi G. Orji
M. Badaroglu
Bryan M. Barnes
C Beitia
Benjamin Bunday
U. Celano
R J Kline
M. Neisser
Y. Obeng
András E. Vladár
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Metrology for the next generation of semiconductor devices
2018
Ndubuisi G. Orji
M. Badaroglu
Bryan M. Barnes
C Beitia
Benjamin Bunday
U. Celano
R J Kline
M. Neisser
Y. Obeng
András E. Vladár
Show All
Source
Cite
Save
Citations (110)
1