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C. W. Soo
C. W. Soo
Analysis Group
Engineering
Electronic engineering
Residual
p–n junction
Root cause
1
Papers
3
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0
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Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect
2017
Microelectronics Reliability
S.P. Neo
A. C. T. Quah
G. B. Ang
D. Nagalingam
H. H. Ma
S. L. Ting
C. W. Soo
C. Q. Chen
Z. H. Mai
Jeffrey Lam
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Citations (3)
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