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S.P. Neo
S.P. Neo
Analysis Group
Electronic engineering
Optoelectronics
Materials science
Transistor
Engineering
4
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5
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Defect Prediction Approach to enhance Static Fault Localization of Functional Logic Failure Defects using NIR Photon Emission Microscopy
2018
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
D. Nagalingam
A. C. T. Quah
S. Moon
G. B. Ang
S. L. Ting
H. H. Ma
S.P. Neo
Z. H. Mai
Jeffrey Lam
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Citations (2)
Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect
2017
Microelectronics Reliability
S.P. Neo
A. C. T. Quah
G. B. Ang
D. Nagalingam
H. H. Ma
S. L. Ting
C. W. Soo
C. Q. Chen
Z. H. Mai
Jeffrey Lam
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Citations (3)
Defect localization enhancement using light induced CI-AFP
2014
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
N. Dayanand
A. C. T. Quah
C. Q. Chen
S.P. Neo
G. B. Ang
M. Gunawardana
Z. H. Mai
Jeffrey Lam
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Failure analysis methodology for gate oxide breakdown induced by PID
2010
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
David Zhu
S. K Loh
S.P. Neo
Ghim Boon Ang
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