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Aberration-corrected Scanning
Aberration-corrected Scanning
Ion beam
Information transfer
Focused ion beam
Crystallography
Epitaxy
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Atomic Scale Characterization of Crystal Defect in Epitaxial Silicon by Aberration-corrected STEM and Low Energy FIB Sample Preparation
2011
N. Hashikawa
S Saito
S. Sonoda
N. Nakajima
Y. Kunimune
K. Asayama
Aberration-corrected Scanning
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