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Mahalingam Anbu Selvam
Mahalingam Anbu Selvam
Dielectric strength
Time-dependent gate oxide breakdown
Porosity
Capacitor
Materials science
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me Dependent Dielectric Breakdown (TDDB) Improvem
2015
Mary Claire Silvestre
Mahalingam Anbu Selvam
John Schaller
Lee Jong Hyup
Cristiano Capasso
Patrick Justison
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