Interferometric detection for terahertz microscopy

We describe an implementation of continuous wave microscopy in the millimeter - terahertz wave region in with phase imaging is realized using a simple low cost detection scheme. Samples are illuminated using a Backward Wave Oscillator system and a detection scheme is presented in which soft or semitransparent samples are imaged in reflection or transmission using an interferometer. The main advantage of this approach is that simple pyroelectric detectors can be used and can in principle be extended to use in near field measurements.