An overview of scanning near-field optical microscopy in characterization of nano-materials
2014
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.
Keywords:
- Scanning confocal electron microscopy
- Scanning probe microscopy
- Vibrational analysis with scanning probe microscopy
- Scanning ion-conductance microscopy
- Scanning capacitance microscopy
- Near-field scanning optical microscope
- Microscopy
- Scanning gate microscopy
- Analytical chemistry
- Optics
- Materials science
- Nanotechnology
- Optical sectioning
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