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A 576k 3.5-ns access BiCMOS ECL static ram with array built-in self test
A 576k 3.5-ns access BiCMOS ECL static ram with array built-in self test
1991
Henry A. Bonges
D. Adams
A.J. Allen
Roy Childs Flaker
T Frederick
L. Gilbert
Kenneth S. Gray
Erik L. Hedberg
T. Holman
G.M. Lattimore
D.A. Lavalette
Kim Y. Nguyen
Alan L. Roberts
Keywords:
Electronic engineering
Computer science
Decoding methods
BiCMOS
Resistor
Built-in self-test
Voltage
Static random-access memory
CMOS
Computer hardware
random access memory
Correction
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