Old Web
English
Sign In
Acemap
>
authorDetail
>
Kenneth S. Gray
Kenneth S. Gray
IBM
Computer science
Electronic engineering
BiCMOS
Static random-access memory
Built-in self-test
3
Papers
30
Citations
0.01
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
A 576 K 3.5-ns access BiCMOS ECL static RAM with array built-in self-test
1992
IEEE Journal of Solid-state Circuits
Henry A. Bonges
Robert Dean Adams
A.J. Allen
Roy Childs Flaker
Kenneth S. Gray
Erik L. Hedberg
W.T. Holman
G.M. Lattimore
D.A. Lavalette
Kim Y. Nguyen
Alan L. Roberts
Show All
Source
Cite
Save
Citations (16)
A 576k 3.5-ns access BiCMOS ECL static ram with array built-in self test
1991
VLSIC | Symposium on VLSI Circuits
Henry A. Bonges
D. Adams
A.J. Allen
Roy Childs Flaker
T Frederick
L. Gilbert
Kenneth S. Gray
Erik L. Hedberg
T. Holman
G.M. Lattimore
D.A. Lavalette
Kim Y. Nguyen
Alan L. Roberts
Show All
Source
Cite
Save
Citations (6)
Cross-coupled charge-transfer sense amplifier and latch sense scheme for high-density FET memories
1980
Ibm Journal of Research and Development
Kenneth S. Gray
Show All
Source
Cite
Save
Citations (8)
1