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D.A. Lavalette
D.A. Lavalette
IBM
BiCMOS
Computer science
Static random-access memory
Built-in self-test
Electronic engineering
2
Papers
22
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A 576 K 3.5-ns access BiCMOS ECL static RAM with array built-in self-test
1992
IEEE Journal of Solid-state Circuits
Henry A. Bonges
Robert Dean Adams
A.J. Allen
Roy Childs Flaker
Kenneth S. Gray
Erik L. Hedberg
W.T. Holman
G.M. Lattimore
D.A. Lavalette
Kim Y. Nguyen
Alan L. Roberts
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Citations (16)
A 576k 3.5-ns access BiCMOS ECL static ram with array built-in self test
1991
VLSIC | Symposium on VLSI Circuits
Henry A. Bonges
D. Adams
A.J. Allen
Roy Childs Flaker
T Frederick
L. Gilbert
Kenneth S. Gray
Erik L. Hedberg
T. Holman
G.M. Lattimore
D.A. Lavalette
Kim Y. Nguyen
Alan L. Roberts
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Citations (6)
1