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Single event burnout in power MOSFET caused by high-energy ions
Single event burnout in power MOSFET caused by high-energy ions
1999
Sumio Matsuda
Satoshi Kuboyama
Takahiro Suzuki
Takayuki Hirose
Hideharu Ohira
Tsuyoshi Kono
Masayuki Kase
matuda sumio
kuboyama satosi
suzuki takahiro
hirose takayuki
oohira hideharu
kouno tuyosi
kase masayuki
Keywords:
Burnout
Semiconductor device
Breakdown voltage
MOSFET
Ion
Power MOSFET
Electrical engineering
Electronic engineering
Materials science
single event burnout
high energy
Engineering physics
heavy ion
Correction
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