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hirose takayuki
hirose takayuki
Power MOSFET
single event burnout
Semiconductor device
Breakdown voltage
Electrical engineering
3
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Single event burnout in power MOSFET caused by high-energy ions
1999
Sumio Matsuda
Satoshi Kuboyama
Takahiro Suzuki
Takayuki Hirose
Hideharu Ohira
Tsuyoshi Kono
Masayuki Kase
matuda sumio
kuboyama satosi
suzuki takahiro
hirose takayuki
oohira hideharu
kouno tuyosi
kase masayuki
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Experimental study of Single Event Burnout (SEB) hardening on power MOSFET
1998
Sumio Matsuda
Satoshi Kuboyama
Shinichi Shugyo
Takahiro Suzuki
Kenji Sugimoto
Takayuki Hirose
Hideharu Ohira
Tsuyoshi Kono
Masayuki Kase
matuda sumio
kuboyama satosi
syugyou sin'iti
suzuki takahiro
sugimoto kenzi
hirose takayuki
oohira hideharu
kouno tuyosi
kase masayuki
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An evaluation of single event upset on memories
1997
Sumio Matsuda
Takao Akutsu
Shinichi Shugyo
Masao Nakamura
Kenji Sugimoto
Takayuki Hirose
Hideharu Ohira
Yuki Nagai
Tsuyoshi Kono
Naohito Inabe
matuda sumio
akutu akira otto
syugyou sin'iti
nakamura masao
sugimoto kenzi
hirose takayuki
oohira hideharu
nagai yuki
kouno tuyosi
inabe hisato
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