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A. Gupta
A. Gupta
GlobalFoundries
Electronic engineering
process conditions
Logic gate
Optoelectronics
Gate oxide
3
Papers
1
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0
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Self-heating characterization and its applications in technology development
2020
NATW | North Atlantic Test Workshop
P. Paliwoda
M. Toledano-Luque
T. Nigam
Fernando Guarin
M. Nour
S. Cimino
Luigi Pantisano
A. Gupta
O. H. Gonzalez
M. Hauser
W. Liu
A. Vayshenker
D. Ioannou
Dongho Lee
L. Jiang
P. Yee
Stewart E. Rauch
B. Min
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Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs.
2019
IRPS | International Reliability Physics Symposium
M. Iqbal Mahmud
A. Gupta
Maria Toledano Luque
N. Mavilla
Jennifer A. Johnson
Purushothaman Srinivasan
Abu Naser Zainuddin
S. Rao
S. Cimino
B. Min
T. Nigam
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Reliability-Aware FinFET Design
2019
IEEE Electron Devices Technology and Manufacturing Conference
M. Toledano-Luque
P. Srinivasan. P. Paliwoda
S. Cimino
Z. Chbili
M. Iqbal Mahmud
A. Gupta
T. Shen
T. Kauerauf
B. Zhu
B. Min
T. Nigam
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