Old Web
English
Sign In
Acemap
>
authorDetail
>
B. Zhu
B. Zhu
GlobalFoundries
Semiconductor
CMOS
Logic gate
Reliability engineering
Computer science
1
Papers
0
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Reliability-Aware FinFET Design
2019
IEEE Electron Devices Technology and Manufacturing Conference
M. Toledano-Luque
P. Srinivasan. P. Paliwoda
S. Cimino
Z. Chbili
M. Iqbal Mahmud
A. Gupta
T. Shen
T. Kauerauf
B. Zhu
B. Min
T. Nigam
Show All
Source
Cite
Save
Citations (0)
1