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Heon-Guk Lee
Heon-Guk Lee
Samsung
Electronic engineering
NAND gate
Physics
Charge trap flash
Programmable metallization cell
2
Papers
12
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STO-based Cluster Header Election Algorithm
2019
Jeong-Hyeon Yoon
Heon-Guk Lee
Seung-Ku Kim
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A 2 Gb NAND flash memory with 0.044 /spl mu/m/sup 2/ cell size using 90 nm flash technology
2002
IEDM | International Electron Devices Meeting
Dong-chan Kim
Wang Chul Shin
Jae Duk Lee
Jinhyun Shin
Joon-hee Lee
Sung-Hoi Hur
Ihn-gee Baik
Yoo-Choel Shin
Chang-Hyun Lee
Jae-Sun Yoon
Heon-Guk Lee
Kwon-Soon Jo
Seungwook Choi
Byung-Kwan You
Jeong-Hyuk Choi
Donggun Park
Kinam Kim
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Citations (12)
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