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Byung-Kwan You
Byung-Kwan You
Samsung
Optoelectronics
Electronic engineering
NAND gate
Physics
Charge trap flash
2
Papers
12
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Highly Manufacturable 7 th Generation 3D NAND Flash Memory with COP structure and Double Stack Process
2021
VLSIT | Symposium on VLSI Technology
Jun Hyoung Kim
Yong-Sik Yim
Joon-Sung Lim
Hyun-Suk Kim
Eun-suk Cho
Chadong Yeo
Woongseop Lee
Byung-Kwan You
Byoungil Lee
Min-Kyu Kang
Jang Woojae
Young-Ho Kwon
Keehong Lee
Jae Duk Lee
Myeong-cheol Kim
Jin-Yub Lee
Sung-Hoi Hur
Su Jin Ahn
Hyeongsun Hong
Yu-gyun Shin
Hyoungsub Kim
Jai Hyuk Song
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A 2 Gb NAND flash memory with 0.044 /spl mu/m/sup 2/ cell size using 90 nm flash technology
2002
IEDM | International Electron Devices Meeting
Dong-chan Kim
Wang Chul Shin
Jae Duk Lee
Jinhyun Shin
Joon-hee Lee
Sung-Hoi Hur
Ihn-gee Baik
Yoo-Choel Shin
Chang-Hyun Lee
Jae-Sun Yoon
Heon-Guk Lee
Kwon-Soon Jo
Seungwook Choi
Byung-Kwan You
Jeong-Hyuk Choi
Donggun Park
Kinam Kim
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Citations (12)
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