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Holly M. Edmundson
Holly M. Edmundson
Electronic engineering
Aspect ratio (aeronautics)
Silicon
Critical dimension
CMOS
4
Papers
21
Citations
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Process Development and Optimization for 3 $\mu \text{m}$ High Aspect Ratio Via-Middle Through-Silicon Vias at Wafer Level
2015
IEEE Transactions on Semiconductor Manufacturing
Dingyou Zhang
Daniel Smith
Gopal Kumarapuram
Rudy R. Giridharan
Shinichiro Kakita
Mohamed A. Rabie
Peijie Feng
Holly M. Edmundson
Luke England
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Citations (9)
New interferometric measurement technique for small diameter TSV
2014
ASMC | Advanced Semiconductor Manufacturing Conference
Padraig Timoney
Daniel Fisher
Yeong-Uk Ko
Alok Vaid
Sarasvathi Thangaraju
Daniel Smith
Himani Kamineni
Dingyou Zhang
Ramakanth Alapati
Wonwoo Kim
Ke Xiao
Holly M. Edmundson
Nigel Smith
Brennan Peterson
Hemant Amin
Jonathan Peak
Timothy R.B. Johnson
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Citations (3)
Successful void free gap fill of 3µm, high AR via middle, Through Silicon Vias at wafer level
2014
ASMC | Advanced Semiconductor Manufacturing Conference
Sarasvathi Thangaraju
Luke England
Mohamed A. Rabie
Dingyou Zhang
G. Kumarapuram
R. McGowan
A. Selsley
Rudy R. Giridharan
Sipeng Gu
Vijayalakshmi Seshachalam
C. Wang
Shinichiro Kakita
S. Baral
Wonwoo Kim
Holly M. Edmundson
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Citations (9)
High-Precision Electrolytic Capacitance Tilt Sensor
2009
Holly M. Edmundson
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