Old Web
English
Sign In
Acemap
>
authorDetail
>
R. Ritzenhaler
R. Ritzenhaler
Visualization
Voltage
MOSFET
Field-effect transistor
Electronic engineering
2
Papers
6
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (2)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Mapping of CMOS FET degradation in bias space—Application to dram peripheral devices
2017
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
B. Kaczer
Jacopo Franco
Stanislav Tyaginov
M. Jech
G. Rzepa
Tibor Grasser
B.J. O'Sullivan
R. Ritzenhaler
Tom Schram
Alessio Spessot
Dimitri Linten
Naoto Horiguchi
Show All
Source
Cite
Save
Citations (6)
バイアス空間におけるCMOS FET劣化のマッピング: DRAM周辺デバイスへの応用
2017
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
B. Kaczer
Jacopo Franco
Stanislav Tyaginov
M. Jech
G. Rzepa
Tibor Grasser
B. O’Sullivan
R. Ritzenhaler
Tom Schram
Alessio Spessot
Dimitri Linten
Naoto Horiguchi
Show All
Source
Cite
Save
Citations (0)
1