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B. O’Sullivan
B. O’Sullivan
Katholieke Universiteit Leuven
Extrapolation
AND gate
Electronic engineering
GiST
Voltage
2
Papers
69
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Comphy — A compact-physics framework for unified modeling of BTI
2018
Microelectronics Reliability
G. Rzepa
Jacopo Franco
B. O’Sullivan
A. Subirats
Marko Simicic
Geert Hellings
Pieter Weckx
M. Jech
Theresia Knobloch
M. Waltl
Philippe Roussel
D. Linten
B. Kaczer
Tibor Grasser
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Citations (69)
バイアス空間におけるCMOS FET劣化のマッピング: DRAM周辺デバイスへの応用
2017
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
B. Kaczer
Jacopo Franco
Stanislav Tyaginov
M. Jech
G. Rzepa
Tibor Grasser
B. O’Sullivan
R. Ritzenhaler
Tom Schram
Alessio Spessot
Dimitri Linten
Naoto Horiguchi
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Citations (0)
1