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Santanu Samanta
Santanu Samanta
Cypress Semiconductor
Electronic engineering
Degradation (geology)
Computer science
Oxide
Neuromorphic engineering
5
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10
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In-Memory Computing array using 40nm multibit SONOS achieving 100 TOPS/W energy efficiency for Deep Neural Network Edge Inference Accelerators
2020
IMW | International Memory Workshop
Vineet Agrawal
Venkatraman Prabhakar
Krishnaswamy Ramkumar
Long Hinh
Swatilekha Saha
Santanu Samanta
Ravindra M. Kapre
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Reliability Aspects of SONOS Based Analog Memory for Neuromorphic Computing
2020
IRPS | International Reliability Physics Symposium
Krishnaswamy Ramkumar
Venkatraman Prabhakar
Vineet Agrawal
Long T Hinh
Swatilekha Saha
Santanu Samanta
Ravindra M. Kapre
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Stress voltage dependence HCI induced traps distribution in 60V LDNMOS
2009
IIRW | International Integrated Reliability Workshop
Santanu Samanta
Nayan Patel
K. N. ManjulaRani
Kevin Jang
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Hot-carrier reliability study and simulation methodology development for 65nm technology
2009
IIRW | International Integrated Reliability Workshop
K. N. ManjulaRani
Ram Mohan Mooraka
Nayan Patel
Santanu Samanta
Geetha Narasimhan
N. Lakshminarayanan
Ravindra M. Kapre
Helmut Puchner
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Simulating degradation of TDDB lifetime due to burn-in using pre-conditioning pulses
2007
PSD | International Workshop on Physics of Semiconductor Devices
K. N. ManjulaRani
Santanu Samanta
Nitish Mathur
Helmut Puchner
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