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Y. Kim
Y. Kim
Intel
Electronic engineering
Engineering
Electrical engineering
Non-volatile memory
Architecture
2
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13
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Flash ETOX/spl trade/ virtual ground architecture: a future scaling direction
2005
VLSIT | Symposium on VLSI Technology
Randy J. Koval
V. Bhachawat
C. Chang
M. Hajra
David L. Kencke
Y. Kim
C. Kuo
T. Parent
M. Wei
B.J. Woo
A. Fazio
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Citations (5)
Charge trapping and electron mobility degradation in MOCVD hafnium silicate gate dielectric stack structures
2003
C.D. young
Andreas Kerber
Tuo-Hung Hou
Eduard A. Cartier
George A. Brown
Gennadi Bersuker
Y. Kim
C. Lim
J. Gutt
Patrick S. Lysaght
Joe Bennett
Choonghyun Lee
Sundararaman Gopalan
Mark I. Gardner
Peter Zeitzoff
Guido Groeseneken
Robert W. Murto
H.R. Huff
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Citations (8)
1