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Simone Severi
Simone Severi
Ion implantation
NMOS logic
Leakage (electronics)
Sheet resistance
Depletion region
2
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Co‐Implantation for 45 nm PMOS and NMOS Source‐Drain Extension Formation: Device Characterisation Down to 30 nm Physical Gate Length
2006
E. J. H. Collart
Bartek Pawlak
Ray Duffy
E Augendre
Simone Severi
Tom Janssens
Philippe Absil
W. Vandervorst
Susan Felch
R. Scheutelkamp
Nick E. B. Cowern
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PERFORMANCE EVALUATION AND CHOICE CRITERIA OF DATA COMPRESSION ALGORITHMS BY EXTENSIVE TEST ON CSE DATA BASE
1990
Physica B-condensed Matter
Rossella Bedini
Daniel S. Franchi
G.L. Generali
Simone Severi
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