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Jang-ho Kim
Jang-ho Kim
Samsung
Electronic engineering
Materials science
Interconnection
Silicon
Time-dependent gate oxide breakdown
3
Papers
34
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High performance Cu/low-k interconnect strategy beyond 10nm logic technology
2015
IITC | International Interconnect Technology Conference
R.-H. Kim
Byung-hee Kim
Jinseok Kim
Jang-Hee Lee
Jongmin Baek
J.H. Hwang
J.W. Hwang
J. Chang
S.Y. Yoo
T. J. Yim
K.-M. Chung
Kang-Wook Park
T. Oszinda
I. S. Kim
E.B. Lee
Sang-don Nam
S. Jung
Y.W. Cho
Hyunjun Choi
Jang-ho Kim
Sanghoon Ahn
S. H. Park
B. U. Yoon
J.-H. Ku
S.S. Paak
Nae-in Lee
Seungwook Choi
H.K. Kang
Eunseung Jung
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TSV optimization for BEOL interconnection in logic process
2012
DIC | IEEE International D Systems Integration Conference
Sin-Woo Kang
Sung-Dong Cho
Ki-Young Yun
Sangwook Ji
Kisoon Bae
Woon-Seob Lee
Eun-ji Kim
Jang-ho Kim
Jonghoon Cho
Hyongyol Mun
Yeong L. Park
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Citations (21)
Impact of TSV proximity on 45nm CMOS devices in wafer level
2011
IITC | International Interconnect Technology Conference
Sung-Dong Cho
Sin-Woo Kang
Kang-Wook Park
Jae-Chul Kim
Ki-Young Yun
Kisoon Bae
Woon-Seob Lee
Sangwook Ji
Eun-ji Kim
Jang-ho Kim
Yeong L. Park
Eun Seung Jung
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Citations (13)
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