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Sathishkumar Dhayalan
Sathishkumar Dhayalan
Katholieke Universiteit Leuven
Silicon
Epitaxy
Engineering physics
Chemical vapor deposition
Analytical chemistry
3
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44
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Carbon-related defects in Si:C/silicon heterostructures assessed by deep-level transient spectroscopy
2017
ECS Journal of Solid State Science and Technology
Eddy Simoen
Sathishkumar Dhayalan
Andriy Hikavyy
Roger Loo
Erik Rosseel
Henk Vrielinck
Johan Lauwaert
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Material Studies on Si:C Epitaxial Films Grown by CVD
2014
Sathishkumar Dhayalan
Roger Loo
Erik Rosseel
Andriy Hikavyy
Yosuke Shimura
Thomas Nuytten
Olivier Richard
Hugo Bender
Bastien Douhard
Wilfried Vandervorst
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Characterization of Epitaxial Si:C:P and Si:P Layers for Source/Drain Formation in Advanced Bulk FinFETs
2014
Erik Rosseel
Harald Profijt
Andriy Hikavyy
John Tolle
S. Kubicek
Geert Mannaert
Caroline L'abbe
Kurt Wostyn
Naoto Horiguchi
Trudo Clarysse
Brigitte Parmentier
Sathishkumar Dhayalan
Hugo Bender
Jan Maes
Sandeep Mehta
Roger Loo
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Citations (39)
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