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K. S. Suh
K. S. Suh
Samsung
Magnetoresistive random-access memory
Frame (networking)
Reliability (semiconductor)
Computer hardware
Tunnel magnetoresistance
2
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1
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Reliability of STT-MRAM for various embedded applications
2021
IRPS | International Reliability Physics Symposium
Sung-hee Han
Jung Hyoung Lee
K. S. Suh
K. T. Nam
D. E. Jeong
S.C. Oh
Sun-Kyu Hwang
Y. Ji
K.H. Lee
Yoon-Jong Song
Y. G. Hong
Gitae Jeong
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28-nm 0.08 mm 2 /Mb Embedded MRAM for Frame Buffer Memory
2020
IEDM | International Electron Devices Meeting
Sung-hee Han
Jung Moo Lee
H. M. Shin
J.H. Lee
K. S. Suh
K. T. Nam
B. S. Kwon
M. K. Cho
J.Y. Lee
Jun-Ho Jeong
J. H. Park
Se Chung Oh
Sung-il Park
S. H. Hwang
S. S. Pyo
Hyuck-Chai Jung
Y. Ji
J. H. Bak
Dae Sin Kim
W. S. Ham
Yong-Jae Kim
Kyu Pil Lee
Yoon-Jong Song
Gwan-Hyeob Koh
Y. G. Hong
Gitae Jeong
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