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Dae-Woong Kang
Dae-Woong Kang
Samsung
Electronic engineering
Engineering
NAND gate
Electrical engineering
random access memory
5
Papers
116
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A novel write method for improving RESET distribution of PRAM
2017
VLSIT | Symposium on VLSI Technology
Heungsik Park
Kwangseok Lee
S. H. Song
K. G. Lee
Jai Kwang Shin
V. Gangasani
Y. S. Shin
Dae-Woong Kang
J. H. Park
Ki-whan Song
Gwan-Hyeob Koh
Gi-Tae Jeong
Ki-Kwan Park
K. H. Kyung
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A new approach for trap analysis of vertical NAND flash cell using RTN characteristics
2014
IEDM | International Electron Devices Meeting
Dae-Woong Kang
Chang-Sub Lee
Sung-Hoi Hur
Du Heon Song
Jeong-Hyuk Choi
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Citations (9)
A new approach of NAND flash cell trap analysis using RTN characteristics
2011
VLSIT | Symposium on VLSI Technology
Dae-Woong Kang
Sung-Bok Lee
Hyun-Mog Park
Dong-jun Lee
Jun Kim
Junho Seo
Chikyoung Lee
Cheol Song
Chang-Sub Lee
Hyungcheol Shin
Jai Hyuk Song
Haebum Lee
Jeong-Hyuk Choi
Young-Hyun Jun
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Citations (1)
32nm 3-bit 32Gb NAND Flash Memory with DPT (d̲ouble p̲atterning t̲echnology) process for mass production
2010
VLSIT | Symposium on VLSI Technology
Bong Tae Park
Jai Hyuk Song
Eun-suk Cho
Seung Wan Hong
Jae Youn Kim
Yong-ju Choi
Yong-Seok Kim
Seung-Jun Lee
Chi Kyoung Lee
Dae-Woong Kang
Dong-jun Lee
Byoung Taek Kim
Yong Joon Choi
Woon-kyung Lee
Jeong-Hyuk Choi
Kang-Deog Suh
Tae-Sung Jung
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Citations (7)
Two-bit cell operation in diode-switch phase change memory cells with 90nm technology
2008
VLSIT | Symposium on VLSI Technology
Dae-Woong Kang
J.H. Lee
Jeong-Taek Kong
Dae-Won Ha
J. Yu
C.Y. Um
J. H. Park
F. Yeung
J.H. Kim
Woon Ik Park
Y.J. Jeon
Mi-Hyang Lee
Y.J. Song
Jae-joon Oh
Gi-Tae Jeong
Hong Sik Jeong
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Citations (95)
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