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Ki-Kwan Park
Ki-Kwan Park
Samsung
Electronic engineering
Dielectric
Engineering
Electromigration
Physics
3
Papers
5
Citations
0
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A novel write method for improving RESET distribution of PRAM
2017
VLSIT | Symposium on VLSI Technology
Heungsik Park
Kwangseok Lee
S. H. Song
K. G. Lee
Jai Kwang Shin
V. Gangasani
Y. S. Shin
Dae-Woong Kang
J. H. Park
Ki-whan Song
Gwan-Hyeob Koh
Gi-Tae Jeong
Ki-Kwan Park
K. H. Kyung
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Citations (4)
Pre-Metal Dielectric Stress Engineering by a Novel Plasma Treatment and Integration Scheme for nMOS Performance Improvement
2006
VLSIT | Symposium on VLSI Technology
Yong-kuk Jeong
Dong Suk Shin
Andrew-tae Kim
Il-young Yoon
Seo-Woo Nam
Seung-Jin Lee
Ki-Kwan Park
Kyung-hun Kim
Hong-jae Shin
Ki-Bong Roh
Ki-Ho Kang
Yong-Ho Choi
Gi-ho Seo
Kwon Lee
Kang soo Chu
Nae-in Lee
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Alleviating electromigration through re-engineering the interface between Cu & dielectric-diffusion-barrier in 90 nm Cu/SiOC (k=2.9) device
2003
IEDM | International Electron Devices Meeting
Young Jin Wee
Soo Geun Lee
Won Sang Song
Kyoungwoo Lee
Nam-Hyung Lee
Ja Eung Ku
Ki-Kwan Park
Seung-Jin Lee
Jae-Hak Kim
Joo Hyuk Chung
Hong-jae Shin
Sang Rok Hah
Ho-Kyu Kang
Gwang Pyuk Suh
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