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Yun-Jae Lee
Yun-Jae Lee
Samsung
Electronic engineering
Dram
Eutectic system
Materials science
Thin film
3
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11
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0
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Lamellar-structured Ni-silicide film formed by eutectic solidification
2019
Journal of Alloys and Compounds
Jinbum Kim
Younheum Jung
Sungho Lee
Seongpyo Hong
Seongheum Choi
Jinyong Kim
Taejin Park
Eunha Lee
Jung-Yeon Won
Hyung-Ik Lee
Yun-Jae Lee
Bosung Kim
Joong Jung Kim
Y. H. Kim
Ki-Hyun Hwang
Cheol-Woong Yang
Hyoungsub Kim
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Citations (1)
Charge trapping induced DRAM data retention time degradation under wafer-level burn-in stress
2002
IRPS | International Reliability Physics Symposium
Hyeong Won Seo
Gyo-Young Jin
Kihoon Yang
Yun-Jae Lee
Joo-hyun Lee
Du Heon Song
Yong-Chol Oh
Jun-Yong Noh
Seung Wan Hong
Dong-Hyun Kim
Jin-Yang Kim
Hyeong-Hoon Kim
Dae-Joong Won
Won-Seong Lee
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Citations (10)
Effects of WSi_X-Polycide Gate Processes on MOSFET Reliability and Characteristics
2001
SDM | SIAM International Conference on Data Mining
Jin-Yang Kim
Yong-chul Oh
Donghyun Kim
Kyu-Taek Hyun
Hyoung-Woen Seo
Dae-Joong Won
Moon-Mo Jeong
Yun-Jae Lee
Yoon-Jae Man
Sang-Hyun Lee
Ho-Won Sun
Se-Myeong Jang
Chang-Huhn Lee
Hyun Chang Kim
Chang-Kyu Kim
Makoto Yoshida
Woun-Suck Yang
In-Ho Nam
Gyo-Yong Jin
Won-Seong Lee
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