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Dae-Joong Won
Dae-Joong Won
Samsung
Electronic engineering
Dram
Burn-in
Leakage (electronics)
Engineering
3
Papers
13
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0
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Evaluation of STI degradation causing DRAM standby current failure in burn-in mode operation using a carrier injection method
2002
IRPS | International Reliability Physics Symposium
Seung Wan Hong
Gyo-Young Jin
H.W. Seo
Donghee Lee
Jai Hyuk Song
Jinhyun Noh
Y. C. Oh
Jungdong Kim
Deog-Bae Kim
Hyun-Ho Kim
Dae-Joong Won
Wonshik Lee
Du Heon Song
Kyongtaek Lee
Woon-kyung Lee
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Citations (3)
Charge trapping induced DRAM data retention time degradation under wafer-level burn-in stress
2002
IRPS | International Reliability Physics Symposium
Hyeong Won Seo
Gyo-Young Jin
Kihoon Yang
Yun-Jae Lee
Joo-hyun Lee
Du Heon Song
Yong-Chol Oh
Jun-Yong Noh
Seung Wan Hong
Dong-Hyun Kim
Jin-Yang Kim
Hyeong-Hoon Kim
Dae-Joong Won
Won-Seong Lee
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Citations (10)
Effects of WSi_X-Polycide Gate Processes on MOSFET Reliability and Characteristics
2001
SDM | SIAM International Conference on Data Mining
Jin-Yang Kim
Yong-chul Oh
Donghyun Kim
Kyu-Taek Hyun
Hyoung-Woen Seo
Dae-Joong Won
Moon-Mo Jeong
Yun-Jae Lee
Yoon-Jae Man
Sang-Hyun Lee
Ho-Won Sun
Se-Myeong Jang
Chang-Huhn Lee
Hyun Chang Kim
Chang-Kyu Kim
Makoto Yoshida
Woun-Suck Yang
In-Ho Nam
Gyo-Yong Jin
Won-Seong Lee
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